Front / Recto
- Title Architecture (Architektur)
- Negative Date 1928–33
- Print Date 1928–39
- Medium Gelatin silver print
- Dimensions Image 5 7/8 × 8 3/4" (14.9 × 22.3 cm)
- Place Taken Munich
- Credit Line Thomas Walther Collection. Gift of Thomas Walther
- MoMA Accession Number 1831.2001
- Copyright © Estate Franz Roh, Munich
Back / Verso
- Mount Type No mount
- Marks and Inscriptions Inscribed in pencil on sheet verso, left: JB 102-4. Inscribed in pencil on sheet verso, center: 6 [circled]. Stamped in black ink on sheet verso, center: Dr. Franz Roh/HERAUSGEBER VON "FOTOAUGE" UND "FOTOTEK." Inscribed in pencil on sheet verso, bottom center: Architectur.
The artist, Munich; by inheritance to the artist's estate (Juliane Roh, 1909–1987), Munich, 1965; purchased by Galerie Rudolf Kicken, Cologne, c. 1980 . Sold through Christie's New York (sale 8126, lot 202) to Thomas Walther, April 6, 1995 ; given to The Museum of Modern Art, New York, 2001.
 Egidio Marzona, conversation with Thomas Walther, Berlin, April 2014. The image was published in Marzona, Retrospektive Fotografie (Dusseldorf, 1981), p. 57.
 MacGill/Walther 2001(4), p. 11; and Christie’s invoice, April 6, 1995, provided May 1, 1995, by Megan Fox (proxy bidder for Thomas Walther).
- Format Unknown
- Weight Double weight
- Thickness (mm) 0.30
- UV Fluorescence Recto negative Verso negative
- Fiber Analysis Softwood bleached sulfite 97% Hardwood bleached sulfite 3%
- Material Techniques Developing-out paper
This work was determined to be a gelatin silver print via X-ray fluorescence (XRF) spectrometry.
The following elements have been positively identified in the work, through XRF readings taken from its recto and verso (or from the mount, where the verso was not accessible):
- Recto: P, S, Ca, Zn, Sr, Ag, Ba
- Verso: Al, Si, S, K, Ca, Fe, Zn, Sr, Ba
The graphs below show XRF spectra for three areas on the print: two of the recto—from areas of maximum and minimum image density (Dmax and Dmin)—and one of the verso or mount. The background spectrum represents the contribution of the XRF instrument itself. The first graph shows elements identified through the presence of their characteristic peaks in the lower energy range (0 to 8 keV). The second graph shows elements identified through the presence of their characteristic peaks in the higher energy range (8 to 40 keV).