Front / Recto
- Title Untitled
- Negative Date c. 1919
- Print Date c. 1919
- Medium Platinum print
- Dimensions Image 4 13/16 × 3 13/16" (12.2 × 9.7 cm)Mount 13 15/16 × 11" (35.4 × 27.9 cm)
- Place Taken New York
- Credit Line Thomas Walther Collection. Gift of Thomas Walther
- MoMA Accession Number 1693.2001
Back / Verso
- Mount Type Mount (original)
- Marks and Inscriptions Inscribed in pencil on large mount verso, top right: A Fl (show 2 bds). Inscribed in pencil on large mount verso, bottom: Photograph by John P. Heins, Lecturer Clarence H. White School, N.Y./Frances Heins, Trustee, u/w. Inscribed in pencil on large mount verso, bottom right: TW 881003.
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Provenance
The artist, Saratoga Springs, N.Y.; by inheritance to the artist’s wife, Frances Heins, Saratoga Springs, 1969 [1]; to Keith de Lellis, New York, c. 1986 [2]; purchased by Thomas Walther, October 1988 [3]; given to The Museum of Modern Art, New York, 2001.
[1] Keith de Lellis, telephone conversation with Simon Bieling, March 30, 2005.
[2] MacGill/Walther 2000, p. 13; and de Lellis, letter to Audrey Sands, October 26, 2013.
[3] Keith Douglas de Lellis Fine Art Photography invoice, October 10, 1988, annotated with Thomas Walther archival no. TW 881003; and Walther archival no. TW 881003 on mount verso.
Surface
- Surface Sheen Matte
- Techniques Mount Contact print
- PTM
- Micro-raking
Paper Material
- Format Imperial
- UV Fluorescence Recto negative Verso no data
- Fiber Analysis No fiber data available
- Material Techniques Platinum print
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XRF
This work was determined to be a platinum print via X-ray fluorescence (XRF) spectrometry.
The following elements have been positively identified in the work, through XRF readings taken from its recto and verso (or from the mount, where the verso was not accessible):
- Recto: Si, Ca, Mn, Fe, Zn, Pt, Pb
- Mount: Al, Si, S, K, Ca, Mn, Fe, Zn, Pb
The graphs below show XRF spectra for three areas on the print: two of the recto—from areas of maximum and minimum image density (Dmax and Dmin)—and one of the verso or mount. The background spectrum represents the contribution of the XRF instrument itself. The first graph shows elements identified through the presence of their characteristic peaks in the lower energy range (0 to 8 keV). The second graph shows elements identified through the presence of their characteristic peaks in the higher energy range (8 to 40 keV).
In Context
Related People
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Artist
Related Links
- Cultural Hubs New York
- Schools White School, 1914–42