Front / Recto
- Title Untitled
- Negative Date 1927–28
- Print Date 1927–35
- Medium Gelatin silver print
- Dimensions Image 4 1/2 × 3 3/8" (11.5 × 8.6 cm)
- Place Taken Dessau
- Credit Line Thomas Walther Collection. Abbott-Levy Collection funds, by exchange
- MoMA Accession Number 1658.2001
- Copyright © Ursula Kirsten-Collein
Back / Verso
- Mount Type No mount
- Marks and Inscriptions Signed in pencil on sheet verso, center: Heinz Loew. Signed in black ink on sheet verso, right: Collein.
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Provenance
The artists; to the estate of Lotte and Edmund Collein, Berlin [1]; to Mario Smodej, Berlin [2]; purchased by Thomas Walther, February 23, 1993 [3]; purchased by The Museum of Modern Art, New York, 2001.
[1] MacGill/Walther 2001(3), p. 6.
[2] Ibid.
[3] Ibid.; and Mario Smodej invoice, February 23, 1993.
Surface
- Surface Sheen Semireflective
- Techniques Retouching in negative Double exposure
- PTM
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Micro-raking
Raking-light close-up image, as shot. Area of detail is 6.7 x 6.7 mm. Department of Conservation, MoMARaking-light close-up image, processed. Processing included removal of color, equalization of the histogram, and sharpening, all designed to enhance visual comparison. Department of Conservation, MoMA
Paper Material
- Format Metric
- Weight Single weight
- Thickness (mm) 0.19
- UV Fluorescence Recto negative Verso negative
- Fiber Analysis Softwood bleached sulfite 77% Rag 16% Bast 7%
- Material Techniques Developing-out paper
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XRF
This work was determined to be a gelatin silver print via X-ray fluorescence (XRF) spectrometry.
The following elements have been positively identified in the work, through XRF readings taken from its recto and verso (or from the mount, where the verso was not accessible):
- Recto: P, S, Cl, Ca, Zn, Sr, Ag, Ba
- Verso: Al, Si, S, K, Ca, Fe, Zn, Sr, Ba
The graphs below show XRF spectra for three areas on the print: two of the recto—from areas of maximum and minimum image density (Dmax and Dmin)—and one of the verso or mount. The background spectrum represents the contribution of the XRF instrument itself. The first graph shows elements identified through the presence of their characteristic peaks in the lower energy range (0 to 8 keV). The second graph shows elements identified through the presence of their characteristic peaks in the higher energy range (8 to 40 keV).
Areas examined: Recto (Dmax: black; Dmin: green), Verso or Mount (blue), Background (red)
Elements identified: Al, Si, P, S, Cl, K, Ca, Ag, Ba
In Context
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